![]() ![]() Niedrig: Großwinkel-Elektronen-Channeling-Diagramme zur Untersuchung epitaktisch hergestellter Schichten. Niedrig: New display and specimen stage for large angle Kikuchi-like patterns. Joy: The generation and application of SEM electron channelling patterns. Coates: Pseudo-Kikuchi orientation analysis in the SEM. Everhart: Annular diode detector for high annular resolution pseudo-Kikuchi patterns. van Essen: Optimum conditions for generating channelling patterns in the SEM. Newbury: The origin, detection and uses of electron channeling contrast. Joy: Electron channelling patterns in the SEM. Davidson: Electron channelling patterns in the SEM. Booker: Scanning electron microscopy: electron channeling effects, in ĭ.C. Coates: Kikuchi-like reflection patterns obtained with the SEM Phil.Mag. Harland: Electron backscattering patterns - a new technique for obtaining crystallographic information in the SEM. In Developments in Electron Microscopy and Analysis, ed. Volbert: Contrast reversals in the Kikuchi bands of backscattered and transmitted electron diffraction patterns. Ichinokawa: Contrast reversals of Kikuchi bands in transmission electron diffraction. Hall: On the thickness dependence of Kikuchi band contrast. Boersch: Ober Bänder bei Elektronenbeugung. Gemmell: Channelling and related effects in the motion of charged particles through crystals. Lehman: Mass dependence on the angular distribution of charged particle emission from crystals: transition to the classical limit. von Laue: Materiewellen and ihre Interferenzen (Akad. Niedrig: Electron backscattering from thin films. Kuhnle: Zur Anisotropie der Elektronenausbeute in Abhängigkeit von der Energie der auslösenden Primärelektronen von 5–50 keV. Schulson: Interpretation of the width of SEM electron channelling lines. Humphreys: A theoretical model for the energy dependence of electron channelling patterns in the SEM. Hirsch: A dynamical theory for the contrast of perfect and imperfect crystals in the SEM using backscattered electrons. Seidel: The orientation dependence of the electron backscattering coefficient of gold single crystal films. Bühring: Use of Mott scattering cross sections for calculating backscattering of 10–100 keV electrons. Seidel: Orientierungsanisotropie des Rückstreukoeffizienten and der Sekundärelektronenausbeute von 10–100 keV Elektronen. Fontaine: Etude des pseudo-lignes de Kikuchi observeés en microscopie electronique à balayage. Hirsch: Some comments on the interpretation of the Kikuchi-like reflection patterns observed by SEM. Reimer: An experimental proof of the dependent Bloch wave model by large-angle electron scattering from thin crystals. In Scanning Electron Microscopy: systems and applications.(Inst. Boswarva: Pseudo-Kikuchi pattern contrast from tilted specimens. Humphreys: Electron diffraction from tilted specimens and its application in SEM. Lytton: Computer generation and identification of Kikuchi projections. 21 ( Springer, Berlin, Heidelberg 1982 )Ĭ.T. Indenbom: Modern Crystazzography II, Springer Ser. 15 ( Springer, Berlin, Heidelberg 1981 )ī.K. 36 ( Springer, Berlin, Heidelberg 1984 )ī.K. Physics of Image Formation and Microanalysis. Reimer: Transmission Electron Microscopy. Van Landuyt: Modern Diffraction and Imaging Techniques in Material Science ( North-Holland, Amsterdam 1970 ) Whelan: Electron Microscopy of Thin Crystals ( Butterworths, London 1965 ) This process is experimental and the keywords may be updated as the learning algorithm improves. These keywords were added by machine and not by the authors. These patterns contain information about the crystal structure, orientation and distortion. ECP and EBSP are related by the theorem of reciprocity. At oblique incidence of the electron beam, the reflection high-energy electron diffraction (RHEED) pattern may contain Bragg diffraction spots and Kikuchi lines. For a stationary electron probe, the angular distribution of backscattered electrons is modulated by excess and defect Kikuchi bands, leading to an electron backscattering pattern (EBSP) which can be observed on a fluorescent screen or recorded on a photographic emulsion. When rocking an electron probe, this anisotropy of the backscattering results in the electron channelling pattern (ECP). Because a Bloch-wave field has nodes and antinodes at the nuclei and the probability density at the nuclei depends sensitively on the tilt relative to the Bragg position, the backscattering coefficient shows an anisotropy. For the discussion of intensities it is necessary to use the dynamical theory of electron diffraction and the Bloch-wave model. The geometry of a diffraction pattern can be described by the kinematical theory. Electrons are Bragg diffracted at lattice planes. ![]()
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